Thermal-Aware Testing of Digital VLSI Circuits and Systems
BücherAngebote / Angebote:
The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal-aware design and test of digital VLSI chips--
Lieferbar in ca. 10-20 Arbeitstagen