Tel: 061 261 57 67
Warenkorb
Ihr Warenkorb ist leer.
Gesamt
0,00 CHF
  • Start
  • Bücher
  • Residual Stress Measurement by X-Ray Diffraction

Residual Stress Measurement by X-Ray Diffraction

Angebote / Angebote:

This editorial review of J784a is based upon decades of experience in the practical application of x-ray diffraction residual stress measurement methods in thousands of individual applications. J784 is a classic document. It serves as the only recognized standard for residual stress measurement available.
Folgt in ca. 15 Arbeitstagen

Preis

149,00 CHF