Book of Abstracts - 10th CIRP Conference on Computer Aided Tolerancing, Specification and Verification for Assemblies

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Research in metrology and tolerancing is of major interest in design, manufacturing and quality control. Dimensional and geometrical metrology as well as geometrical tolerancing developed rapidly and drastically in the last years due to global changes in production technology and increased requirements regarding economy and safety. The replies in metrology and specification concern the increasing introduction of optical, robust and shop floor suitable methods of augmented accuracy, the dispersion of the coordinate measuring method from tactile techniques to various techniques based on other measuring effects and the provision of new procedures for measurements with sub-nanometer resolution. For assuring maximum significance of measurement results particularly global traceability and uniform strategies for measurement uncertainty evaluation are being developed. Concepts for computer assisted and web-based education and training for metrology reflect the enormous influence of the operator on measurement results. On the other side new mindsets and methods regarding geometrical tolerancing had to be developed and established. This is especially true for assemblies where manufacturing tolerances of the individual parts may sum up, or interact. Modern simulation tools enhance tolerancing and thus help to ensure the function of assembly groups. Advanced tolerancing procedures are needed for the consideration of flexibility of subassemblies and to deal with the special characteristics of the quickly growing field of micro and nano technology. The Conference presents highlights of the evolution of metrology and specification of geometrical tolerances, spots their implication for science, industry and engineering and focuses new techniques of specification and verification. Moreover the Conference brings together researchers and specialists from science and industry to discuss new trends, applications and developments in metrology and tolerancing.